Equipments
- Accurate-Mass Quadrupole Time-of-Flight (Q-TOF) LC/MS
- Asher
- Atomic Force Microscope (AFM, PSIA)
- Atomic Force Microscope (AFM, Asylum)
- Atomic Layer Deposition (ALD,Savannah)
- Atomic Layer Deposition (ALD,Fiji)
- Autoclave
- BET Physisorption-Chemisorption
- Biostats
- Carbondioxide Laser (CO2)
- Cary UV-VIS Spectrophotometer
- Cary Fluorescence Spectrophotometer
- CHNS/O Elemental Analyzer
- Circular Dichroism System (CD)
- Confocal Microscope
- Contact Angle Measurement System
- Critical Point Dryer
- Cut-off and Grinding Machine
- Cryostat
- Dicing Saw
- Differential Scanning Calorimetry (DSC,Netszch)
- Differential Scanning Calorimetry (DSC,TA)
- Dimple Grinder
- Disc Grinder
- Disc Punch
- Dynamic Mechanical Analyzer
- E-Beam Evaporation
- E-Beam Lithography (E-BEAM)
- Electrolytical Thinner
- Ellipsometer (IR-VASE)
- Ellipsometer (V-VASE)
- Env. Scanning Electron Microscope (ESEM)
- Femtosecond Laser System
- Fluorescent and DIC Equipped Upright Microscope
- Fluorescent and DIC Equipped Inverted Microscope
- Fluorospectrometer
- Fiber Tower
- Focused Ion Beam (FIB)
- Freeze Dryer System
- FSP Spectrum Analyzer
- FTIR (Tensor 37)
- FTIR (Thermo)
- FTIR with Microscope
- FT-Raman
- Gas Chromatography Mass Spectrometry (GC/MS)
- Gel Permeation Chromatography (GPC)
- Gel Imaging and Documentation System
- Glass KnifeMaker
- Glovebox
- Gradient Real-Time PCR
- Gradient PCR
- Grinding and Polishing Machines
- He-Cd Laser
- He-Ne Lasers
- High Performance Computer
- High Resolution Mass Time-of-Flight (TOF) LC/MS
- Hot Plates
- Inductively Coupled Plasma (GaN, GaAs)
- Inductively Coupled Plasma (Si)
- Inductively Coupled Plasma-Mass Spectrometry (ICP-MS)
- Infrared Camera
- Isotermal Titration Calorimetry (ITC)
- Lock-In Amplifier
- Low Pressure Chemical Vapor Deposition (LPCVD)
- Mask Aligner
- Mask Aligner with Nanoimprint Lithography
- Mask Writer
- Material Microscopes
- Materials Research Diffractometer (MRD)
- Micromechanical Tester
- Microplate Reader
- Microtome
- Mounting Press
- Multi-Purpose X-Ray Diffractometer(MPD)
- Nuclear Magnetic Resonance (NMR)
- Optical Profilometer
- Optical Spectrum Analyzers
- Organic Thin Film Evaporator
- Plasma Enhanced Chemical Vapor Deposition (PECVD)
- Porosimeter
- Physical Property Measurement System (PPMS)
- Precision Etching Coating System (PECS)
- Precision Ion Polishing System (PIPS)
- Preform Consolidator
- Preparative High Performance Liquid Chromatography (Prep-HPLC)
- Probe Stations
- Pycnometer
- Rapid Thermal Annealing (RTA)
- Rheometer
- Rocking Furnace
- Scanning Electron Microscope(NanoSEM)
- Shaking Incubator
- Semiconductor Parameter Analyzer
- Single-Crystal XRD
- Size Exclusion Chromatography (SEC)
- SNOM + Raman Microscope
- Spinners
- Sputtering System
- Stereomicroscope
- Stylus Profilometer
- Thermal Evaporator
- Thermal Evaporation System
- Thermal Gravimetric Analysis (TGA)
- Three-zone Furnace (1200 C)
- Time-resolved Fluorescence
- Transmission Electron Microscope (TEM)
- Ultracentrifuge
- Ultramicrotome
- Ultrasonic Cutter
- UV-Vis-NIR Spectrophotometer
- Vacuum Impregnation
- Vacuum Ovens
- Wire Bonder
- X-ray Photoelectron Spectroscopy (XPS)
- X-Ray Floresence Spectroscopy (XRF)
- Zeta Potential (Zeta Sizer)
