Equipment
- Accurate-Mass Quadrupole Time-of-Flight (Q-TOF) LC/MS
- Asher
- Atomic Force Microscope (AFM, PSIA)
- Atomic Force Microscope (AFM, Asylum)
- Atomic Layer Deposition (ALD)
- Autoclave
- Carbondioxide Laser (CO2)
- Cary UV-VIS Spectrophotometer
- Cary Fluorescence Spectrophotometer
- Circular Dichroism System (CD)
- Confocal Microscope
- Contact Angle Measurement System
- Critical Point Dryer
- Cut-off and Grinding Machine
- Dicing Saw
- Differential Scanning Calorimetry
- Dimple Grinder
- Disc Grinder
- Disc Punch
- E-Beam Evaporation
- E-Beam Lithography (E-BEAM)
- Electrolytical Thinner
- Ellipsometer (IR-WASE)
- Ellipsometer (V-VASE)
- Env. Scanning Electron Microscope (ESEM)
- Femtosecond Laser System
- FFT Network Analyzer
- Fiber Tower
- Focused Ion Beam (FIB)
- FSP Spectrum Analyzer
- FTIR (Tensor 37)
- FTIR with Microscope
- Function Generator
- Gas Chromatography Mass Spectrometry (GC/MS)
- Gas Permeation Chromatography / Size Exclusion Chromatography (GPC / SEC)
- Glass KnifeMaker
- Glovebox
- Grinding and Polishing Machines
- He-Cd Laser
- He-Ne Lasers
- High Performance Computer
- High Resolution Mass Time-of-Flight (TOF) LC/MS
- Hot Plates
- Inductively Coupled Plasma (GaN, GaAs)
- Inductively Coupled Plasma (Si)
- Infrared Camera
- Isotermal Titration Calorimetry (ITC)
- LCR Meter
- Lock-In Amplifier
- LPCVD
- Mask Aligner
- Mask Aligner with Nanoimprint Lithography
- Mask Writer
- Material Microscope
- Materials Research Diffractometer (MRD)
- Mounting Press
- Multi-Purpose X-Ray Diffractometer
- Network Analyzer
- Nuclear Magnetic Resonance (NMR)
- Optical Microscopes
- Optical Profilometer
- Optical Spectrum Analyzer
- Organic Thin Film Evaporator
- Oscilloscopes
- Oxidation Furnace
- Parameter Analyzer
- PECVD
- Precision Etching Coating System (PECS)
- Precision Ion Polishing System (PIPS)
- Preform Consolidator
- Preparative High Performance Liquid Chromatography (Prep-HPLC)
- Probe Stations
- Rapid Thermal Annealing (RTA)
- Rheometer
- Rocking Furnace
- Semiconductor Parameter Analyzer
- Signal generator
- SNOM + Raman Microscope
- Spectrum Analyzer
- Spinners
- Sputtering System
- Stylus Profilometer
- Thermal Evaporator
- Thermal Evaporation System
- Thermal Gravimetric Analysis (TGA)
- Three-zone Furnace (1200 C)
- Time-resolved Fluorescence
- Transmission Electron Microscope (TEM)
- Ultramicrotome
- Ultrasonic Cutter
- UV-Vis-NIR spectrophotometer
- Vacuum Impregnation
- Vacuum Ovens
- Wire Bonder
- X-ray Photoelectron Spectroscopy (XPS)
- Zeta Potential (Zeta Sizer)
